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1. Optimization of Electrochemical Etching Parameters in FIM/STM Tungsten Nanotip Fabrication

V. Ahmadi

Volume 21, Issue 1 , Winter 2010

Abstract
  Field Ion Microscopy (FIM) and Scanning Tunneling Microscopy (STM) have found a wide application in nanotechnology. These microscopes use a metallic nanotip for image acquisition. Resolution of FIM and STM images depends largely on the radius of nanotip apex; the smaller the radius the higher the resolution. ...  Read More